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Steel

Scantech process control solutions are vital to cost reduction in the steel making processes. At Scantech we believe that less means more. Less problems means more productivity. Less risk means more results. Less variability means more control. Less waste means more final product. Less downtime means more profit. Less time to get a return on your investment, means more on your bottom line, more quickly.

The CM100 gauge combined with the C-scan display system are an important tool in iron making, providing real time analysis of the dry weight of coke prior to entering the blast furnace. This enables improvements in blast furnace efficiency.

The consistency of sinter composition can be controlled through the application of a Geoscan-M. The basicity is a key quality parameter that can be improved through controlled blending of iron ores with limestone. This process can be automated for maximum effectiveness.

Scantech’s process control technology can supercharge your plant productivity and give you powerful business solutions to significanty cut your costs and deliver ever-greater efficiencies. As well as providing a working day free of malfunctions, downtime and lost productivity.

Related Products

CM 200 The CM 200 Conductive Material Moisture Monitor is a direct, on-conveyor monitor for measuring moisture in conductive mineral materials. Fast neutron and gamma transmission is the most ...

"Accurate online measurement information and diagnostics show how the machines and the plant are working; a single piece of data can make or break the process"

Kari Heikkilä, Metso, Minerals Processing and Aggregate Production, 2013

Conferences

AISTech 2024 – Columbus, USA 07/05/2024

Meet Henry Kurth and Ryan Khoo at the Scantech Booth (#1302).. Read More

CIM 2024 Conference & Expo – Vancouver, Canada 12/05/2024

Meet Henry Kurth and Ryan Khoo at the Scantech Booth (#500) at the Expo.. Read More

World Congress on Sampling and Blending – Johannesburg, South Africa 21/05/2024

Meet George Ndoh Tabi from Scantech at the conference.. Read More

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